Title :
A Novel Channel Characteristics Estimation Methodology for High-Speed SerDes Interface on Flip-Chip Ball Grid Array Packages
Author :
Cheng-Yu Ho ; Hung-Hsiang Cheng ; Po-Chih Pan ; Chen-Chao Wang ; Chih-Pin Hung
Author_Institution :
Electr. Lab., Adv. Semicond. Eng. Inc., Kaohsiung, Taiwan
Abstract :
This paper develops a systematic method to estimate the channel characteristics of a high-speed serializer/deserializer (SerDes) interface that is implemented on a build-up laminate flip-chip ball grid array (FCBGA) package. A microstrip multisize ring resonator method is developed to determine the extracted dielectric characteristics of a low-loss build-up substrate. The critical dimensions of the measurement structure of a high-speed SerDes interface are determined using scanning electron microscopy to estimate the channel characteristics. Finally, electromagnetic modeling is performed to systematically validate the measured mixed-mode S-parameters with the help of a double-sided probing system. The proposed systematic validation methodology is successfully validated by making the measurements of the high-speed SerDes interface up to 10 GHz.
Keywords :
S-parameters; ball grid arrays; channel estimation; flip-chip devices; microstrip resonators; scanning electron microscopy; channel characteristics estimation; double-sided probing system; electromagnetic modeling; flip-chip ball grid array packages; frequency 10 GHz; high-speed serializer/deserializer interface; microstrip multisize ring resonator; mixed-mode S-parameters; scanning electron microscopy; Dielectrics; Electromagnetic modeling; Microstrip resonators; Optical ring resonators; Resonant frequency; Scanning electron microscopy; Substrates; System validation; Double-sided probing system; electromagnetic (EM) modeling; flip-chip ball grid array (FCBGA) package; low-loss build-up substrate; microstrip multisize ring resonators; mixed-mode $S$ -parameter; mixed-mode S-parameter; scanning electron microscopy (SEM); serializer/deserializer (SerDes); systematic validation methodology; systematic validation methodology.;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2015.2478480