• DocumentCode
    3610710
  • Title

    A Novel Channel Characteristics Estimation Methodology for High-Speed SerDes Interface on Flip-Chip Ball Grid Array Packages

  • Author

    Cheng-Yu Ho ; Hung-Hsiang Cheng ; Po-Chih Pan ; Chen-Chao Wang ; Chih-Pin Hung

  • Author_Institution
    Electr. Lab., Adv. Semicond. Eng. Inc., Kaohsiung, Taiwan
  • Volume
    5
  • Issue
    12
  • fYear
    2015
  • Firstpage
    1784
  • Lastpage
    1792
  • Abstract
    This paper develops a systematic method to estimate the channel characteristics of a high-speed serializer/deserializer (SerDes) interface that is implemented on a build-up laminate flip-chip ball grid array (FCBGA) package. A microstrip multisize ring resonator method is developed to determine the extracted dielectric characteristics of a low-loss build-up substrate. The critical dimensions of the measurement structure of a high-speed SerDes interface are determined using scanning electron microscopy to estimate the channel characteristics. Finally, electromagnetic modeling is performed to systematically validate the measured mixed-mode S-parameters with the help of a double-sided probing system. The proposed systematic validation methodology is successfully validated by making the measurements of the high-speed SerDes interface up to 10 GHz.
  • Keywords
    S-parameters; ball grid arrays; channel estimation; flip-chip devices; microstrip resonators; scanning electron microscopy; channel characteristics estimation; double-sided probing system; electromagnetic modeling; flip-chip ball grid array packages; frequency 10 GHz; high-speed serializer/deserializer interface; microstrip multisize ring resonator; mixed-mode S-parameters; scanning electron microscopy; Dielectrics; Electromagnetic modeling; Microstrip resonators; Optical ring resonators; Resonant frequency; Scanning electron microscopy; Substrates; System validation; Double-sided probing system; electromagnetic (EM) modeling; flip-chip ball grid array (FCBGA) package; low-loss build-up substrate; microstrip multisize ring resonators; mixed-mode $S$ -parameter; mixed-mode S-parameter; scanning electron microscopy (SEM); serializer/deserializer (SerDes); systematic validation methodology; systematic validation methodology.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2015.2478480
  • Filename
    7331147