An Unconditionally Stable FDTD Model for Crosstalk Analysis of VLSI Interconnects

Author

Kumar, Vobulapuram Ramesh ; Alam, Arsalan ; Kaushik, Brajesh Kumar ; Patnaik, Amalendu

Author_Institution

Microelectron. & VLSI Group, IIT Roorkee, Roorkee, India

Volume

5

Issue

12

fYear

2015

Firstpage

1810

Lastpage

1817

Abstract

In this paper, an unconditionally stable finite-difference time-domain (US-FDTD) model is proposed for the crosstalk noise analysis of coupled very large scale integration interconnects. The accuracy of the proposed model is validated against the conventional FDTD model and HSPICE. It is observed that the proposed model is as accurate as the conventional FDTD and HSPICE. It is also observed that the stability of the proposed model is not constrained by the Courant-Friedrichs-Lewy stability condition. Depending on the time-step size, the proposed model can be up to 100× faster than the conventional FDTD.

Keywords

VLSI; finite difference time-domain analysis; integrated circuit interconnections; HSPICE; VLSI interconnects; crosstalk noise analysis; finite-difference time-domain model; unconditionally stable FDTD model; very large scale integration interconnects; CMOS technology; Crosstalk; Finite difference methods; Semiconductor device modeling; Stability analysis; Time-domain analysis; Very large scale integration; CMOS; Courant-Friedrichs-Lewy (CFL) stability condition; Courant???Friedrichs???Lewy (CFL) stability condition; crosstalk; finite-difference time-domain (FDTD); unconditionally stable; very large scale integration (VLSI) interconnects; very large scale integration (VLSI) interconnects.;

fLanguage

English

Journal_Title

Components, Packaging and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

2156-3950

Type

jour

DOI

10.1109/TCPMT.2015.2494519

Filename

7331253