Title :
RF Characterization of Magnetodielectric Material Using Cavity Perturbation Technique
Author :
Kyu Han ; Swaminathan, Madhavan ; Pulugurtha, Raj ; Sharma, Himani ; Tummala, Rao ; Rawlings, Brandon M. ; Nair, Vijay
Author_Institution :
ViaSat, Duluth, GA, USA
Abstract :
Magnetodielectric (MD) materials find application in many areas of microwave engineering, and therefore, measurement of their dielectric and magnetic properties is very important. This paper presents a novel MD material characterization method using the cavity perturbation technique (CPT) with substrate-integrated waveguide (SIW) cavity resonators. Frequency dependent complex permittivity and permeability of MD material can be extracted with a single SIW cavity structure by inserting the sample material into different locations. The fundamental theory of CPT is explained and its analysis for SIW cavity is discussed. Cobalt nanoparticles are synthesized with a fluoropolymer matrix to realize the MD materials and their properties are measured in the frequency range 1-4 GHz. The effect of volume fraction and density of the synthesized MD materials on the dielectric and magnetic properties has been studied.
Keywords :
cavity resonators; dielectric materials; nanoparticles; perturbation techniques; substrate integrated waveguides; RF characterization; cavity perturbation technique; cobalt nanoparticles; complex permeability; fluoropolymer matrix; frequency 1 GHz to 4 GHz; frequency dependent complex permittivity; magnetodielectric material; substrate-integrated waveguide cavity resonators; Antennas; Cavity resonators; Dielectric materials; Permeability; Permittivity; Permittivity measurement; Characterization; complex permeability; complex permittivity; extraction; magnetodielectric (MD) material; miniaturization; miniaturization.;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2015.2465383