• DocumentCode
    3611425
  • Title

    Technical theme topics

  • Author

    Christopoulos, Christos

  • Volume
    4
  • Issue
    3
  • fYear
    2015
  • Firstpage
    67
  • Lastpage
    67
  • Abstract
    The EMC theme addressed in the current issue of the Magazine is the Characterization of Emissions from PCBs Based on Near-field Scanning. When trying to predict emissions from complex structures one has two options.
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2162-2264
  • Type

    jour

  • DOI
    10.1109/MEMC.2015.7336758
  • Filename
    7336758
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3611425