DocumentCode :
3611425
Title :
Technical theme topics
Author :
Christopoulos, Christos
Volume :
4
Issue :
3
fYear :
2015
Firstpage :
67
Lastpage :
67
Abstract :
The EMC theme addressed in the current issue of the Magazine is the Characterization of Emissions from PCBs Based on Near-field Scanning. When trying to predict emissions from complex structures one has two options.
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2015.7336758
Filename :
7336758
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3611425
