DocumentCode :
3611428
Title :
Near-field measurement of stochastic electromagnetic fields
Author :
Russer, Johannes A. ; Uddin, Nasir ; Awny, Ahmed Sanaa ; Thiede, Andreas ; Russer, Peter
Author_Institution :
Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
Volume :
4
Issue :
3
fYear :
2015
Firstpage :
79
Lastpage :
85
Abstract :
Stochastic electromagnetic fields with Gaussian amplitude probability distribution can be fully described by auto- and cross correlation spectra of the field components. The cross correlation spectra have to be known for the pairs of field components taken at different spatial points. Integrated electric dipole and magnetic loop probes together with active electronics in AlGaAs/GaAs-HEMT and SiGe:C-HBT technologies are presented. While the probes allow for a spatial resolution in the 100 μm range, integrated amplifiers provide about 30 dB gain over a bandwidth of about 10 GHz.
Keywords :
Gaussian distribution; electromagnetic fields; stochastic processes; Gaussian amplitude probability distribution; cross correlation spectra; integrated electric dipole; magnetic loop probes; near-field measurement; stochastic electromagnetic fields; Electromagnetic fields; Electromagnetic interference; Integrated circuit modeling; Magnetic field measurement; Near-field radiation; Stochastic processes;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2015.7336761
Filename :
7336761
Link To Document :
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