Title :
Multiple Plasmon-Induced Transparency Responses in a Subwavelength Inclined Ring Resonators System
Author :
Kunhua Wen ; Yihua Hu ; Li Chen ; Jinyun Zhou ; Miao He ; Liang Lei ; Ziming Meng
Author_Institution :
Sch. of Phys. & Optoelectron. Eng., Guangdong Univ. of Technol., Guangzhou, China
Abstract :
On the basis of single metal-insulator-metal (MIM) ring resonator (RR) structure, which acts as a band-stopped filter, a dual RR (DRR) system is proposed to obtain the plasmon-induced transparency (PIT) effect. By rotating the second RR an angle, double PIT windows are achieved due to the dual interference effects, which are attributed to different excitation pathways from the first RR to the second RR. In addition, triple PIT peaks are also achieved by adding an extra inclined RR to the DRR system. Phase shifts, which will occur at each transparency window, are also achieved and analyzed. These compact MIM waveguide structures may be used in the highly integrated optical circuits for biochemical sensors optical signal processing, and optical data storage.
Keywords :
MIM structures; band-stop filters; biosensors; chemical sensors; integrated optics; optical filters; optical information processing; optical resonators; optical waveguides; optical windows; plasmons; transparency; MIM ring resonator; band-stopped filter; biochemical sensors; compact MIM waveguide structures; double PIT windows; dual RR structure; dual interference effects; excitation pathways; integrated optical circuits; multiple plasmon-induced transparency response; optical data storage; optical signal processing; phase shifts; single metal-insulator-metal ring resonator; subwavelength inclined ring resonators system; transparency window; Atom optics; Dispersion; Interference; MIM devices; Optical filters; Optical ring resonators; Optical waveguides; Metal???insulator???metal (MIM); metal-insulator-metal; plasmon-induced transparency; plasmon-induced transparency (PIT); ring resonator (RR); ring-resonator;
Journal_Title :
Photonics Journal, IEEE
DOI :
10.1109/JPHOT.2015.2504966