Title :
Radiation Hardening of Voltage References Using Chopper Stabilization
Author :
Shetler, K.J. ; Atkinson, N.M. ; Holman, W.T. ; Kauppila, J.S. ; Loveless, T.D. ; Witulski, A.F. ; Bhuva, B.L. ; Zhang, E.X. ; Massengill, L.W.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
A technique for enhancing the precision of voltage references in an ionizing radiation environment is presented. Radiation-induced mismatch is identified as a fundamental source of error in voltage reference topologies, and chopper offset cancellation is used to mitigate the effect. The efficacy of the proposed technique is demonstrated by irradiating test chips fabricated in a commercial 180-nm process.
Keywords :
choppers (circuits); integrated circuit manufacture; integrated circuit testing; radiation hardening (electronics); reference circuits; chopper offset cancellation; chopper stabilization; ionizing radiation; radiation hardening; radiation-induced mismatch; size 180 nm; test chips fabricated; voltage reference topologies; Bipolar transistors; CMOS integrated circuits; Choppers (circuits); Operational amplifiers; Radiation effects; Radiation hardening (electronics); Voltage measurement; Analog/mixed-signal; chopper; offset cancellation; radiation; radiation-hardening by design (RHBD); total ionizing dose; voltage reference;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2499171
