Title :
RHA Implications of Proton on Gold-Plated Package Structures in SEE Evaluations
Author :
Turflinger, T.L. ; Clymer, D.A. ; Mason, L.W. ; Stone, S. ; George, J.S. ; Savage, M. ; Koga, R. ; Beach, E. ; Huntington, K.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
Proton single event dielectric rupture was observed in Analog Devices OP470 devices only when the package included gold flashing facing the die on the inner surface of the metal lid. The supply voltage was also a factor. Analysis shows that proton on gold fission fragments have the linear energy transfer and range to cause this effect. The physics of proton on gold reactions and radiation hardness assurance implications are explored.
Keywords :
electronics packaging; gold; proton effects; radiation hardening (electronics); Au; OP470 device; RHA implications; SEE evaluations; gold fission fragment; gold flashing; gold plated package structure; linear energy transfer; proton effect; proton single event dielectric rupture; radiation hardness assurance; Dielectrics; Gold; Radiation hardening (electronics); Single event upsets; Destructive single event effects; radiation hardness assurance; single event dielectric rupture; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2496288
