Title :
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
Author :
Bosser, A. ; Gupta, V. ; Tsiligiannis, G. ; Javanainen, A. ; Kettunen, H. ; Puchner, H. ; Saigne, F. ; Virtanen, A. ; Wrobel, F. ; Dilillo, L.
Author_Institution :
Dept. of Phys., Univ. of Jyvaskyla, Jyväskyla, Finland
Abstract :
During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
Keywords :
random-access storage; MCU clustering methodologies; RAM; cross-section estimation; multiple cell upset error patterns; Error analysis; Radiation effects; Random access memory; Single event upsets; Cluster of bit flips; RAM; SEFI; dynamic test; multiple cell upset (MCU); radiation testing; single event upset (SEU); static test;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2496874
