• DocumentCode
    3611966
  • Title

    Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

  • Author

    Bosser, A. ; Gupta, V. ; Tsiligiannis, G. ; Javanainen, A. ; Kettunen, H. ; Puchner, H. ; Saigne, F. ; Virtanen, A. ; Wrobel, F. ; Dilillo, L.

  • Author_Institution
    Dept. of Phys., Univ. of Jyvaskyla, Jyväskyla, Finland
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • Firstpage
    2620
  • Lastpage
    2626
  • Abstract
    During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
  • Keywords
    random-access storage; MCU clustering methodologies; RAM; cross-section estimation; multiple cell upset error patterns; Error analysis; Radiation effects; Random access memory; Single event upsets; Cluster of bit flips; RAM; SEFI; dynamic test; multiple cell upset (MCU); radiation testing; single event upset (SEU); static test;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2496874
  • Filename
    7348948
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3611966