DocumentCode :
3612743
Title :
Temperature characteristics of single-crystal silicon electret microphones
Author :
Yasuno, Yoshinobu ; Itoh, Taira ; Yamada, Ayako ; Nojima, Yasuo ; Kidokoro, Kenichi ; Tajima, Toshifumi ; Iguchi, Yoshinori
Author_Institution :
Kobayasi Inst. of Phys. Res., Kokubunji, Japan
Volume :
22
Issue :
6
fYear :
2015
fDate :
12/1/2015 12:00:00 AM
Firstpage :
3658
Lastpage :
3662
Abstract :
Silicon Electret Condenser Microphones (Si-ECMs) are being studied to achieve small size, high performance, and reliability using Micro Electro Mechanical System (MEMS) technology. Increased robustness and stability are important to ensure wider use. In particular, temperature characteristics for microphones must be evaluated. Here, we focus on the diaphragm and impedance converter, which are the main factors determining the temperature characteristics of microphones, and present a method for measuring temperature characteristics and evaluating results for each parameter. The experimental Si-ECMs were found to have good temperature characteristics compared to a conventional ECM. These results indicate that the Si-ECM has the potential to be applied for measurement.
Keywords :
diaphragms; electrets; elemental semiconductors; impedance convertors; microphones; microsensors; silicon; Si; diaphragm; impedance converter; microelectromechanical system; single crystal silicon electret microphones; temperature characteristics; Electrets; Frequency measurement; Microphones; Silicon; Temperature; Temperature measurement; Temperature sensors; Electrets; electrostatic devices; micro lectromechanical device; microphones;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2015.004919
Filename :
7367567
Link To Document :
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