DocumentCode :
3612987
Title :
Design and analysis of efficient synthesis algorithms for EDAC functions in FPGAs
Author :
Colodro-Conde, Carlos ; Toledo-Moreo, Rafael
Author_Institution :
Dept. of Electron. & Comput. Technol., Univ. Politec. de Cartagena, Murcia, Spain
Volume :
51
Issue :
4
fYear :
2015
Firstpage :
3332
Lastpage :
3347
Abstract :
Error detection and correction (EDAC) functions have been widely used for protecting memories from single event upsets (SEU), which occur in environments with high levels of radiation or in deep submicron manufacturing technologies. This paper presents three novel synthesis algorithms that obtain area-efficient implementations for a given EDAC function, with the ultimate aim of reducing the number of sensitive configuration bits in SRAM-based field-programmable gate arrays (FPGAs). Having less sensitive bits results in a lower chance of suffering an SEU in the EDAC circuitry, thus improving the overall reliability of the whole system. Besides minimizing area, the proposed algorithms also focus on improving other figures of merit like circuit speed and power consumption. The executed benchmarks show that, when compared with other modern synthesis tools, the proposed algorithms can reduce the number of utilized look-up tables (LUTs) up to a 34.48%. Such large reductions in area usage ultimately result in reliability improvements over 10% for the implemented EDAC cores, measured as MTBF (mean time between failures). On the other hand, maximum path delays and power consumptions can be reduced up to a 17.72% and 34.37%, respectively, on the placed and routed designs.
Keywords :
VLSI; error correction; error detection; field programmable gate arrays; integrated circuit reliability; radiation hardening (electronics); table lookup; EDAC function; FPGAs; SRAM-based field-programmable gate arrays; error detection and correction functions; look-up tables; mean time between failures; reliability; single event upsets; Algorithm design and analysis; Error detection; Field programmable gate arrays; Optimization; Power demand; Single event upsets; Table lookup;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/TAES.2015.140823
Filename :
7376258
Link To Document :
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