• DocumentCode
    3613369
  • Title

    Influence of adsorption-desorption process on resonant frequency and noise of micro- and nanocantilevers

  • Author

    Z. Djuric;I. Jokic;M. Franklovic;O. Jaksic

  • Author_Institution
    Dept. of Microelectron. Technol. & Single Crystals, Inst. of Chem., Technol. & Metall., Belgrade, Serbia
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    243
  • Abstract
    Scientists in the field of NEMS today are focused on the problem of achieving the lowest detectable mass of the atomic force microscope and molecular microscope probes. This paper deals with this problem starting from the theory of the adsorption-desorption noise and also the noise caused by temperature fluctuations and Johnson´s noise. We found that the adsorption-desorption noise clearly exceeds the noise of the other sources at lower frequencies. According to the results we obtained for a typical microcantilever fabricated by NEMS processes, the order of magnitude of the noise equivalent mass (NEM) is NEM/spl sim/10/sup 4/ D (1 D=1.7/spl middot/10/sup -27/ kg).
  • Keywords
    "Resonant frequency","Atomic force microscopy","Fluctuations","Nanoelectromechanical systems","Atomic measurements","Frequency measurement","Noise measurement","Micromechanical devices","Force measurement","Frequency estimation"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2002. MIEL 2002. 23rd International Conference on
  • Print_ISBN
    0-7803-7235-2
  • Type

    conf

  • DOI
    10.1109/MIEL.2002.1003185
  • Filename
    1003185