DocumentCode
3613369
Title
Influence of adsorption-desorption process on resonant frequency and noise of micro- and nanocantilevers
Author
Z. Djuric;I. Jokic;M. Franklovic;O. Jaksic
Author_Institution
Dept. of Microelectron. Technol. & Single Crystals, Inst. of Chem., Technol. & Metall., Belgrade, Serbia
Volume
1
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
243
Abstract
Scientists in the field of NEMS today are focused on the problem of achieving the lowest detectable mass of the atomic force microscope and molecular microscope probes. This paper deals with this problem starting from the theory of the adsorption-desorption noise and also the noise caused by temperature fluctuations and Johnson´s noise. We found that the adsorption-desorption noise clearly exceeds the noise of the other sources at lower frequencies. According to the results we obtained for a typical microcantilever fabricated by NEMS processes, the order of magnitude of the noise equivalent mass (NEM) is NEM/spl sim/10/sup 4/ D (1 D=1.7/spl middot/10/sup -27/ kg).
Keywords
"Resonant frequency","Atomic force microscopy","Fluctuations","Nanoelectromechanical systems","Atomic measurements","Frequency measurement","Noise measurement","Micromechanical devices","Force measurement","Frequency estimation"
Publisher
ieee
Conference_Titel
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN
0-7803-7235-2
Type
conf
DOI
10.1109/MIEL.2002.1003185
Filename
1003185
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