Title :
Symmetrical thick film EMI/RFI filters
Author :
V. Desnica;L. Zivanov;O. Aleksic;M. Lukovic
Author_Institution :
Fac. of Tech. Sci., Novi Sad Univ., Serbia
fDate :
6/24/1905 12:00:00 AM
Abstract :
Thick film technology using a well-known concept is presented as a workable approach for integration of passive components. This work states seventeen (17) different symmetrical EMI/RFI (electromagnetic interference/radio frequency interference) filter designs. Attenuation and Smith charts of symmetrical EMI/RFI filters are measured on network analyzer in the range of 1MHz to 3 GHz.
Keywords :
"Thick films","Electromagnetic interference","Radiofrequency interference","Surface-mount technology","Circuit noise","Power harmonic filters","Optical filters","Scanning electron microscopy","Attenuation","Electromagnetic radiation"
Conference_Titel :
Microelectronics, 2002. MIEL 2002. 23rd International Conference on
Print_ISBN :
0-7803-7235-2
DOI :
10.1109/MIEL.2002.1003211
