On some properties of the convolution algorithms for the thermal analysis of semiconductor devices

This paper deals with three kinds of convolution algorithms dedicated to the thermal analysis of semiconductor devices as well as electronic circuits. The fundamental features such as stability, convergence and accuracy of these algorithms are considered and investigated in the paper. In the investigations carried out the exponential test function describing the dissipated power is taken into account. It was analytically proved that the considered algorithms are stable and convergent. The analytical formulas describing the values of the local and total cut off error of the algorithms are proposed. The theoretical considerations are completed by some calculation results illustrating the influence of the values of the thermal parameter models and the size of the analysis step on the accuracy of calculations with the use of the considered algorithms.