DocumentCode
3614153
Title
Combining dual-supply, dual-threshold and transistor sizing for power reduction
Author
S. Augsburger;B. Nikolic
Author_Institution
Enterprise Processors Div., Intel Corp., Santa Clara, CA, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
316
Lastpage
321
Abstract
Multiple supply voltages, multiple transistor thresholds and transistor sizing could be used to reduce the power dissipation of digital blocks. This paper presents a framework for evaluating the effectiveness of each of these approaches independently and in conjunction with each other. Results show the advantages of multiple supply, transistor sizing, and multiple threshold can be compounded to maximize power reduction. The order of application of these techniques determines the final savings in active and leakage power.
Keywords
"Threshold voltage","Energy consumption","Power dissipation","Leakage current","Delay","Very large scale integration","Throughput","Dynamic voltage scaling","CMOS technology","Power generation"
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
ISSN
1063-6404
Print_ISBN
0-7695-1700-5
Type
conf
DOI
10.1109/ICCD.2002.1106788
Filename
1106788
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