مرکز منطقه ای اطلاع رساني علوم و فناوري - A DFT methodology for high-speed MCM based on boundary scan techniques

DocumentCode :

3614354

Title :

A DFT methodology for high-speed MCM based on boundary scan techniques

Author :

Y. Sameshima;T. Fukazawa

Author_Institution :

NTT Optical Network Systems Labs.

fYear :

1998

Firstpage :

521

Lastpage :

525

Keywords :

"Design for testability","Test pattern generators","Propagation delay","Logic testing","Delay effects","Signal design","Signal generators"

Publisher :

ieee

Conference_Titel :

Test Symposium, 1998. ATS ´98. Proceedings. Seventh Asian

ISSN :

1081-7735

Print_ISBN :

0-8186-8277-9

Type :

conf

DOI :

10.1109/ATS.1998.1191704

Filename :

1191704

Link To Document :