• DocumentCode
    3614692
  • Title

    Ion implanted InP and InGaAs for ultrafast optoelectronic applications

  • Author

    S. Marcinkevicius;C. Carmody;A. Gaarder;H.H. Tan;C. Jagadish

  • Author_Institution
    Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Kista, Sweden
  • fYear
    2003
  • fDate
    6/25/1905 12:00:00 AM
  • Firstpage
    195
  • Lastpage
    196
  • Abstract
    Even though low-temperature growth allows one to obtain InP and InGaAs layers with short electron lifetimes, these layers are hardly applicable for ultrafast optoelectronic devices because of the low resistivity. Therefore, to produce layers with ultrashort carrier lifetimes and high resistivity, other methods should be employed. Here we explore an alternative technique, namely, heavy ion implantation, which has proved to be a viable alternative to the LT growth, at least in the case of GaAs.
  • Keywords
    "Indium phosphide","Indium gallium arsenide","Conductivity","Annealing","Temperature","Iron","Wavelength measurement","Optical materials","Gallium arsenide","Photonic band gap"
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 2003. International Symposium on
  • Print_ISBN
    0-7803-7820-2
  • Type

    conf

  • DOI
    10.1109/ISCS.2003.1239972
  • Filename
    1239972