Title :
Ion implanted InP and InGaAs for ultrafast optoelectronic applications
Author :
S. Marcinkevicius;C. Carmody;A. Gaarder;H.H. Tan;C. Jagadish
Author_Institution :
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Kista, Sweden
fDate :
6/25/1905 12:00:00 AM
Abstract :
Even though low-temperature growth allows one to obtain InP and InGaAs layers with short electron lifetimes, these layers are hardly applicable for ultrafast optoelectronic devices because of the low resistivity. Therefore, to produce layers with ultrashort carrier lifetimes and high resistivity, other methods should be employed. Here we explore an alternative technique, namely, heavy ion implantation, which has proved to be a viable alternative to the LT growth, at least in the case of GaAs.
Keywords :
"Indium phosphide","Indium gallium arsenide","Conductivity","Annealing","Temperature","Iron","Wavelength measurement","Optical materials","Gallium arsenide","Photonic band gap"
Conference_Titel :
Compound Semiconductors, 2003. International Symposium on
Print_ISBN :
0-7803-7820-2
DOI :
10.1109/ISCS.2003.1239972