DocumentCode :
3614760
Title :
Broadband electrical characterization of microwave substrates using T-resonator technique
Author :
B. Jokanovic;M. Rakic
Author_Institution :
Inst. IMTEL, Novi Beograd, Serbia
Volume :
1
fYear :
2003
fDate :
6/25/1905 12:00:00 AM
Firstpage :
348
Abstract :
This paper presents an improved method for broadband characterization of microwave substrates. The method is based on response measurement of an open microstrip T-resonator and calculations of an effective length of the resonator using given substrate characteristics and electromagnetic 3D analysis. Two Rogers´ dielectric substrates are measured: TMM 10 and RO 30101 in 1 to 27 GHz band.
Keywords :
"Microwave theory and techniques","Dielectric substrates","Dielectric measurements","Frequency measurement","Resonance","Electromagnetic measurements","Dielectric constant","Microwave integrated circuits","Length measurement","Microstrip resonators"
Publisher :
ieee
Conference_Titel :
Telecommunications in Modern Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on
Print_ISBN :
0-7803-7963-2
Type :
conf
DOI :
10.1109/TELSKS.2003.1246242
Filename :
1246242
Link To Document :
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