Title :
Deterministic test generation for digital circuits by cellular automata in a Java applet
Author :
T. Pikula;E. Gramatova;M. Fischerova
Author_Institution :
Inst. of Informatics, Slovak Acad. of Sci., Bratislava, Slovakia
fDate :
6/25/1905 12:00:00 AM
Abstract :
The paper presents implementation of a test pattern generation algorithm that uses cellular automata with bit flipping to generate a pre-computed test set. The algorithm is realized as a Java applet for automatic synthesis of the built-in self-test structure into a digital circuit modeled in VHDL using only its VHDL entity. This software tool is available on the Internet.
Keywords :
"Circuit testing","Automatic testing","Digital circuits","Java","Test pattern generators","Automatic test pattern generation","Circuit synthesis","Built-in self-test","Software tools","Internet"
Conference_Titel :
EUROCON 2003. Computer as a Tool. The IEEE Region 8
Print_ISBN :
0-7803-7763-X
DOI :
10.1109/EURCON.2003.1248141
