Title :
The evaluation of accelerated reliability tests in microelectronics
Author_Institution :
Dept. of Technol. in Electron., Kosice Tech. Univ., Slovakia
fDate :
6/25/1905 12:00:00 AM
Abstract :
The aim of the described work is to provide simple evaluation of the elementary method for electronic modules testing and monitoring of technological process´s quality in microelectronic production, too. Testing method enables to gain, archive and evaluate basic material characteristics for various electronics elements, modules interconnections and devices from the long-time stability point of view. Prediction of the reliability, quality and length of technical life for mentioned electronics products through observed changes is possible. This paper try to discusses this problem from the position of practical utilisation in microelectronics production.
Keywords :
"Life estimation","Microelectronics","Production","Degradation","Life testing","Condition monitoring","Temperature","Electronic equipment testing","Acceleration","Energy states"
Conference_Titel :
Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
Print_ISBN :
0-7803-8002-9
DOI :
10.1109/ISSE.2003.1260579
