Structured CAD: technology closure for modern ASICs [Tutorial]
Author :
L. Stok;J. Koehl
Author_Institution :
IBM T.J. Watson Research Center
Volume :
1
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Keywords :
"Tutorial","Application specific integrated circuits","Algorithm design and analysis","Design automation","Design for manufacture","Hardware","Application software","Silicon","Laboratories","Virtual manufacturing"
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
