• DocumentCode
    3615144
  • Title

    Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors

  • Author

    Nenadovic; Mijalkovic; Nanver; Vandamme; Schellevis; d´Alessandro; Slotboom

  • Author_Institution
    DIMES, Delft Univ. of Technol., Netherlands
  • fYear
    2003
  • fDate
    6/25/1905 12:00:00 AM
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rotational complex function.
  • Keywords
    "Bipolar transistors","Semiconductor device modeling","Silicon on insulator technology","Silicon"
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
  • ISSN
    1088-9299
  • Print_ISBN
    0-7803-7800-8
  • Type

    conf

  • DOI
    10.1109/BIPOL.2003.1274950
  • Filename
    1274950
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3615144