Title :
Extraction and modelling of self-heating and mutual thermal coupling impedance of bipolar transistors
Author :
Nenadovic; Mijalkovic; Nanver; Vandamme; Schellevis; d´Alessandro; Slotboom
Author_Institution :
DIMES, Delft Univ. of Technol., Netherlands
fDate :
6/25/1905 12:00:00 AM
Abstract :
Sensitive measurement of the self-heating and mutual thermal coupling impedance of bipolar transistors is performed with a low-distortion signal generator and a lock-in amplifier. Thermal impedance is extracted for several silicon-on-glass test structures. The extracted thermal impedances are fitted in the frequency domain to a rotational complex function.
Keywords :
"Bipolar transistors","Semiconductor device modeling","Silicon on insulator technology","Silicon"
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
Print_ISBN :
0-7803-7800-8
DOI :
10.1109/BIPOL.2003.1274950
