Title :
Very thin layers prepared by laser ablation from Bi/sub 2/Te/sub 3/ target
Author :
R. Zeipl;S. Karamazov;M. Jelinek;P. Lostak;M. Pavelka;S. Winiarz;R. Czajka;J. Vanis;F. Sroubek;J. Zelinka;J. Walachova
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
fDate :
6/25/1905 12:00:00 AM
Abstract :
Transport properties are presented for 60nm thick layers which were prepared by the laser ablation from a Bi/sub 2/Te/sub 3/ target. The layers are deposited on quartz glass substrates. The energy density of the laser beam I on the target is 2Jcm/sup -2/ and the temperature of the substrate during deposition varies between (200-480/spl deg/C) for different samples. The influence of the temperature of the substrate during the deposition on topography of layers measured by Scanning Tunnelling Microscope (STM) is presented. The BiTe and Bi/sub 2/Te phases are detected by the X-ray Diffraction (XRD) method.
Keywords :
"Laser ablation","Bismuth","Tellurium","Temperature","Glass","Laser beams","Surfaces","Tunneling","Microscopy","Phase detection"
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN :
0-7803-8301-X
DOI :
10.1109/ICT.2003.1287518
