Title :
Invar-a new approach to EDA benchmark generation
Author :
M. Kunes;M. Danek
Author_Institution :
Dept. of Comput. Sci. & Eng., Czech Tech. Univ., Prague, Czech Republic
fDate :
6/25/1905 12:00:00 AM
Abstract :
This article introduces a new method for generating benchmark circuits. Common methods of testing physical design algorithms and functional verifications used today rely on standardised sets of widely accepted benchmark circuits, or on generating a random benchmark circuit based on its desired characteristics. Although these approaches are suitable in many situations, sometimes it is advantageous to know an exact function of a benchmark circuit. This article introduces a new method for generating benchmarks that is based on structural modifications of a user-specified design without altering its function. The method uses a set of pre-defined operations on a circuit netlist. The method is demonstrated on several examples.
Keywords :
"Electronic design automation and methodology","Benchmark testing","Circuit testing","Algorithm design and analysis","Computer science","Character generation","Field programmable gate arrays","Documentation","Runtime","Logic circuits"
Conference_Titel :
Microelectronics, 2003. ICM 2003. Proceedings of the 15th International Conference on
Print_ISBN :
977-05-2010-1
DOI :
10.1109/ICM.2003.238304