3615396

When digital becomes analog - Interfaces in high speed test

W. Maichen

Teradyne

2004

6/26/1905 12:00:00 AM

"Data engineering","Design engineering","Clocks","Frequency","Transmission line theory","System performance","System testing","Signal design","Probes"

ieee

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

1093-0167

0-7695-2134-7

conf

10.1109/VTEST.2004.1299212

1299212