DocumentCode :
3615398
Title :
Memory test and self-test for deep sub-micron technologies
Author :
D. Adams
Author_Institution :
Magma-DA
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Keywords :
"Automatic testing","Built-in self-test","Design engineering","Redundancy","Product design","Technology management","Engineering management","Memory management","Cams","Nonvolatile memory"
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN :
1093-0167
Print_ISBN :
0-7695-2134-7
Type :
conf
DOI :
10.1109/VTEST.2004.1299214
Filename :
1299214
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3615398
