3615399

Statistical methods for VLSI test, quality and reliability

A. Singh

Auburn University

2004

6/26/1905 12:00:00 AM

"Statistical analysis","Very large scale integration","Circuit testing","Reliability engineering","Design engineering","Engineering management","Statistical distributions","Manufacturing","Delay effects","Optimization methods"

ieee

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

1093-0167

0-7695-2134-7

conf

10.1109/VTEST.2004.1299215

1299215