DocumentCode
3615747
Title
Low-area on-chip circuit for jitter measurement in a phase-locked loop
Author
J.M. Cazeaux;M. Omana;C. Metra
Author_Institution
DEIS, Bologna Univ., Italy
fYear
2004
fDate
6/26/1905 12:00:00 AM
Firstpage
17
Lastpage
22
Abstract
In this paper we propose a novel on-chip circuit to measure the jitter present at the output of phase-locked-loops (PLLs) used for synthesizing a clock with equal or higher frequency than the input clock. This measure is performed at every period of the PLL reference clock. The obtained digital outputs are encoded by means of a thermometer code. Our proposed circuit is able to measure the jitter of PLLs, providing an output frequency in the GHz range. Compared to other available techniques, that proposed here requires lower cost in terms of area overhead (implying an increase in PLL area <4%) and circuit complexity, while featuring comparable accuracy and test time.
Keywords
"Jitter","Phase measurement","Phase locked loops","Clocks","Frequency measurement","Circuit testing","Circuit synthesis","Frequency synthesizers","Performance evaluation","Costs"
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN
0-7695-2180-0
Type
conf
DOI
10.1109/OLT.2004.1319654
Filename
1319654
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