DocumentCode :
3615958
Title :
Opportunities with the open architecture test system
Author :
K. Hatayama;R. Rajsuman; Cheng-Wen Wu;Y. Nishimura;S. Chakradhar;A. Merschon;D. Petrich;T. Tada
Author_Institution :
Renesas Technology
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
334
Lastpage :
334
Keywords :
"System testing","Research and development","Semiconductor device testing","Laboratories","Test equipment","Costs","Integrated circuit testing","Semiconductor device manufacture"
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Print_ISBN :
0-7803-8175-0
Type :
conf
DOI :
10.1109/ASPDAC.2004.1337591
Filename :
1337591
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3615958
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