• DocumentCode
    3615959
  • Title

    New opportunities with the open architecture test system

  • Author

    A. Merschon

  • Author_Institution
    GuideTech
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    341
  • Lastpage
    341
  • Keywords
    "System testing","Instruments","Throughput","Timing jitter","Production systems","Semiconductor device testing","Costs","Frequency measurement","Time measurement","Data analysis"
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337595
  • Filename
    1337595
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3615959