3615959

New opportunities with the open architecture test system

A. Merschon

GuideTech

2004

6/26/1905 12:00:00 AM

341

341

"System testing","Instruments","Throughput","Timing jitter","Production systems","Semiconductor device testing","Costs","Frequency measurement","Time measurement","Data analysis"

ieee

Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific

0-7803-8175-0

conf

10.1109/ASPDAC.2004.1337595

1337595