DocumentCode
3616272
Title
Low-frequency noise measurement of optoelectronic devices
Author
M. Jankovec;F. Smole;M. Topic
Author_Institution
Fac. of Electr. Eng., Ljubljana Univ., Slovenia
Volume
1
fYear
2004
fDate
6/26/1905 12:00:00 AM
Firstpage
11
Abstract
A noise measurement setup was designed with emphasis on low frequency noise characterization of optoelectronic devices. Two different low noise amplifiers can be chosen according to desired measurement quantity. By using voltage amplifier SR560, the noise floor of 280nV//spl radic/Hz can be achieved, while for current amplifier an equivalent input current get down to 10fA//spl radic/Hz both at f=100 mHz. The noise spectra can be acquired by a SR780 FFT network signal analyzer in the range from 102.4 KHz down to 244 /spl mu/Hz. The amplifiers feature built in battery power supply, which together with an effective shielding arrangement enables good low frequency interference protection in noisy environments.
Keywords
"Low-frequency noise","Noise measurement","Optoelectronic devices","Working environment noise","Low-noise amplifiers","Voltage","Signal analysis","Batteries","Power supplies","Frequency"
Publisher
ieee
Conference_Titel
Electrotechnical Conference, 2004. MELECON 2004. Proceedings of the 12th IEEE Mediterranean
Print_ISBN
0-7803-8271-4
Type
conf
DOI
10.1109/MELCON.2004.1346758
Filename
1346758
Link To Document