DocumentCode
3616332
Title
All-pass SC biquad reconfiguration scheme for oscillation based analog BIST
Author
U. Kac;F. Novak
Author_Institution
Josef Stefan Institute
fYear
2004
fDate
6/26/1905 12:00:00 AM
Firstpage
133
Lastpage
138
Keywords
"Built-in self-test","Circuit testing","Transfer functions","Filters","Circuit faults","Capacitors","Oscillators","Frequency measurement","Electrical fault detection","Filtering"
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347626
Filename
1347626
Link To Document