DocumentCode :
3616332
Title :
All-pass SC biquad reconfiguration scheme for oscillation based analog BIST
Author :
U. Kac;F. Novak
Author_Institution :
Josef Stefan Institute
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
133
Lastpage :
138
Keywords :
"Built-in self-test","Circuit testing","Transfer functions","Filters","Circuit faults","Capacitors","Oscillators","Frequency measurement","Electrical fault detection","Filtering"
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
Type :
conf
DOI :
10.1109/ETSYM.2004.1347626
Filename :
1347626
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3616332
