Automatic profiling of a steady state temperature field in thermochemical systems and devices

This work presents a method of the steady state temperature profiling in the case of industrial thermochemical systems. A problem of this type represents an important element of the production processes in different industrial area such as: material engineering, manufacturing of semiconductor devices and VLSI systems, the monocrystals growth etc. The proposed method Is oriented towards the automation of the profiling process allowing to significantly reducing the duration of this operation. The papers covers theoretical basis of the method as well as examples of industrial applications.