Title :
Overlapping variance estimators for simulations
Author :
C. Alexopoulos;D. Goldsman;N.T. Argon;G. Tokol
Author_Institution :
Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
6/26/1905 12:00:00 AM
Abstract :
We examine properties of overlapped versions of the standardized time series area and Cramer-von Mises estimators for the variance parameter of a stationary stochastic process, e.g., a steady-state simulation output process. We find that the overlapping estimators have the same bias properties as, but lower variance than, their nonoverlapping counterparts; the new estimators also perform well against the benchmark batch means estimator. We illustrate our findings with analytical and Monte Carlo examples.
Keywords :
"Sociotechnical systems","Modeling","Steady-state","Analysis of variance","Argon","Analytical models","Random variables","Systems engineering and theory","Industrial engineering","Stochastic processes"
Conference_Titel :
Simulation Conference, 2004. Proceedings of the 2004 Winter
Print_ISBN :
0-7803-8786-4
DOI :
10.1109/WSC.2004.1371384