• DocumentCode
    3618028
  • Title

    Mean crystallite size, size distribution and root mean square residual microstrain measurement from X-ray line broadening of milled ZnSe nano-powders

  • Author

    R. Radoi;M. Danila;P. Fernandez;J. Piqueras

  • Author_Institution
    Nat. Inst. for Res. & Dev. in Microtechnol., Bucharest, Romania
  • Volume
    2
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    505
  • Abstract
    One of the simplest available ways of producing nano-structured materials (i.e., nano-powders) is the milling (grinding) technique. However, producing nano-powders with a crystallite size down to 10 nanometers is a very daunting task. In this application-oriented study, we have investigated the structural changes of commercially available ZnSe powders induced by the milling process. Those changes were revealed by the wide angle X-ray diffraction technique using the X-ray line broadening (´direct´, Stokes Fourier method, Hall-Williamson and Warren-Averbach method). We found that the initial powder had a crystallite size D/spl sim/90 nm (Scherrer equation) and a micro-strain /spl epsiv/=/spl Delta/d/d/spl sim/10/sup -5/. After 40 hours of grinding the ZnSe powder had a crystallite size D of 12-14 nm and /spl epsiv//spl sim/3.9 10/sup -3/.
  • Keywords
    "Crystallization","Root mean square","Size measurement","Zinc compounds","Powders","Nanostructured materials","Milling","Crystalline materials","X-ray diffraction","Equations"
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
  • Print_ISBN
    0-7803-8499-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2004.1403061
  • Filename
    1403061