• DocumentCode
    3618380
  • Title

    Phase-sensitive time-domain terahertz reflectometry

  • Author

    A. Pashkin;F. Kadlec;H. Nemec;P. Kuzel

  • Author_Institution
    Inst. of Phys., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    373
  • Lastpage
    374
  • Abstract
    We review a recently developed method for measuring the terahertz reflectivity able to provide correctly both the amplitude and the phase of terahertz radiation reflected from the sample. Thus it is possible to evaluate the complex optical constants of opaque materials including crystals, ceramics and thin films.
  • Keywords
    "Time domain analysis","Reflectometry","Optical films","Submillimeter wave measurements","Phase measurement","Reflectivity","Crystalline materials","Optical materials","Crystals","Ceramics"
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
  • Print_ISBN
    0-7803-8490-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2004.1422117
  • Filename
    1422117
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3618380