• DocumentCode
    3618858
  • Title

    Characterization of InP epitaxial layers for use in radiation detection

  • Author

    I. Zavadil;K. Zd´ansky;O. Prochazkova;H. Kozak

  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    247
  • Lastpage
    250
  • Keywords
    "Indium phosphide","Epitaxial layers","Radiation detectors","Conductivity","Conducting materials","Temperature measurement","Impurities","Luminescence","Epitaxial growth","Cerium"
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. The Fifth International Conference on
  • Print_ISBN
    0-7803-8335-7
  • Type

    conf

  • DOI
    10.1109/ASDAM.2004.1441207
  • Filename
    1441207