DocumentCode
3618858
Title
Characterization of InP epitaxial layers for use in radiation detection
Author
I. Zavadil;K. Zd´ansky;O. Prochazkova;H. Kozak
fYear
2004
fDate
6/26/1905 12:00:00 AM
Firstpage
247
Lastpage
250
Keywords
"Indium phosphide","Epitaxial layers","Radiation detectors","Conductivity","Conducting materials","Temperature measurement","Impurities","Luminescence","Epitaxial growth","Cerium"
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. The Fifth International Conference on
Print_ISBN
0-7803-8335-7
Type
conf
DOI
10.1109/ASDAM.2004.1441207
Filename
1441207
Link To Document