• DocumentCode
    3619081
  • Title

    Techniques for sensitizing RF path under SER test

  • Author

    J. Dabrowski;J.G. Bayon

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Sweden
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    4843
  • Abstract
    This work presents two techniques for sensitizing the RF loopback path for an integrated transceiver under SER test. The test aims at spot defects typical of the CMOS process. At the chip level the spot defects are represented by impairments in gain and/or noise figure. The sensitization is based on SNR control of the test stimulus or on using a tuned interferer. In both cases power level control is crucial. The discussion is supported by simulation experiments.
  • Keywords
    "Radio frequency","Transceivers","Noise figure","Noise measurement","Signal to noise ratio","Circuit faults","Degradation","Circuit testing","Baseband","CMOS process"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465717
  • Filename
    1465717
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619081