Comparison between responses of silicon and thermoluminescence detectors to pulses from X-ray lamp

The X-ray doses from a standard X-ray flash lamp were measured by means of two different kinds of detectors: standard silicon PIN diode and LiF(Mg,Cu,P) thermoluminescence detector. A detection head of special kind has been developed to perform comparison measurements between the detectors. They were placed behind a 7 mum aluminum filter and exposed to the X-ray beam generated by the X-ray lamp. Two series of 15 shots from the lamp were performed. In each of them the pulses from each PIN diode was measured on an oscilloscope. The irradiated TLDs, which were previously calibrated, were read out with a TOLEDO automatic reader by measuring the integrated dose after a heating cycle. In this way it was possible to obtain the energy deposited by the X-ray bursts in each pellet and compare it with that measured by the silicon detector (obtained from the collected charge). Finally, having a double layer of TLDs, it was also possible to distinguish the hard component of the X-ray beam, which could penetrate the 1-mm thickness of the LiF TLD material