• DocumentCode
    3619264
  • Title

    Recursive learning: a new implication technique for efficient solutions to CAD problems-test, verification, and optimization

  • Author

    W. Kunz;D.K. Pradhan

  • Volume
    2
  • fYear
    2003
  • fDate
    6/25/1905 12:00:00 AM
  • Firstpage
    350
  • Lastpage
    365
  • Keywords
    "Circuit testing","Logic testing","Circuit faults","Combinational circuits","Logic circuits","Logic design","Helium","Large Hadron Collider","DH-HEMTs","Digital circuits"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2003. Tutorial Guide: ISCAS 2003. The IEEE International Symposium on
  • Print_ISBN
    0-7803-7991-8
  • Type

    conf

  • DOI
    10.1109/TUTCAS.2003.1490927
  • Filename
    1490927
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619264