Title :
Modeling of transients caused by a laser attack on smart cards
Author :
D. Leroy;S.J. Piestrak;F. Monteiro;A. Dandache
Author_Institution :
iRoC Technol. SA, Grenoble, France
fDate :
6/27/1905 12:00:00 AM
Abstract :
Several techniques for extracting data from smart cards have been described in the literature, including the so called differential fault analysis (DFA) that relies on perturbing the chip operations to deduce the data. In this paper, we present some experimental results of the DFA that relies on using a laser beam.
Keywords :
"Laser modes","Smart cards","CMOS logic circuits","Doped fiber amplifiers","Laser beam cutting","Circuit testing","Circuit faults","Laser beams","Logic gates","Inverters"
Conference_Titel :
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN :
0-7695-2406-0
DOI :
10.1109/IOLTS.2005.43
