DocumentCode :
3619439
Title :
A Study of Temperature Distribution in SOI-Smart Power Devices in Transient Conditions by Optical Interferometry
Author :
N. Seliger;D. Pogany;C. Furbock;P. Habas;E. Gornik;M. Stoisiek
Author_Institution :
TU Vienna, Austria
fYear :
1997
fDate :
6/19/1905 12:00:00 AM
Firstpage :
512
Lastpage :
515
Keywords :
"Temperature distribution","Optical interferometry","Optical resonators","Laser beams","Optical refraction","Optical variables control","Transient analysis","Power measurement","Optical devices","Reflectivity"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
Type :
conf
DOI :
10.1109/ESSDERC.1997.194478
Filename :
1503408
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619439
