• DocumentCode
    3619441
  • Title

    Noise performances and hot carrier efects in polysilicon thin film transistors

  • Author

    A. Pecora;S. Giovannini;R. Carluccio;L. Mariucci;G. Fortunato

  • Author_Institution
    IESS-CNR, Italy
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    620
  • Lastpage
    623
  • Keywords
    "Hot carriers","Thin film transistors","Semiconductor device noise","Current measurement","Fluctuations","Degradation","Interface states","Noise measurement","Hot carrier effects","Performance analysis"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194505
  • Filename
    1503435
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619441