DocumentCode :
3619441
Title :
Noise performances and hot carrier efects in polysilicon thin film transistors
Author :
A. Pecora;S. Giovannini;R. Carluccio;L. Mariucci;G. Fortunato
Author_Institution :
IESS-CNR, Italy
fYear :
1997
fDate :
6/19/1905 12:00:00 AM
Firstpage :
620
Lastpage :
623
Keywords :
"Hot carriers","Thin film transistors","Semiconductor device noise","Current measurement","Fluctuations","Degradation","Interface states","Noise measurement","Hot carrier effects","Performance analysis"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
Type :
conf
DOI :
10.1109/ESSDERC.1997.194505
Filename :
1503435
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619441
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