3619448

Rapid IC Performance Yield and distribution prediction using a rotation of the circuit parameter principals components

J. Horan;C. Lyden

Cork Regional Technical College, Ireland

1997

6/19/1905 12:00:00 AM

648

651

"Circuits","Costs","Sampling methods","Yield estimation","Ring oscillators","Educational institutions","Computational efficiency","Computational modeling","Analysis of variance","Principal component analysis"

ieee

Solid-State Device Research Conference, 1997. Proceeding of the 27th European

2-86332-221-4

conf

10.1109/ESSDERC.1997.194512

1503442