• DocumentCode
    3619449
  • Title

    Measurement of Channel Length and Off-set Region Length for Off-set Gate MOSFETs

  • Author

    K. Terada;K. Tsuji;Y. Itoh;M. Takahashi

  • Author_Institution
    Hiroshima City University, Japan
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    652
  • Lastpage
    655
  • Keywords
    "Length measurement","MOSFETs","Threshold voltage","FETs","Data mining","Testing","National electric code","H infinity control","Impurities","Electrodes"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194513
  • Filename
    1503443
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619449