DocumentCode :
3619450
Title :
Efficient Parameter Extraction and Statistical Analysis for a 0.25um low-power CMOS Process
Author :
E.V. Saavedra Diaz;K.G. McCarthy;D.B.M. Klaassen;A. Mathewson
Author_Institution :
National Microelectronics Research Centre, Cork, Ireland
fYear :
1997
fDate :
6/19/1905 12:00:00 AM
Firstpage :
656
Lastpage :
659
Keywords :
"Parameter extraction","Statistical analysis","CMOS process","Current measurement","Semiconductor device modeling","Threshold voltage","Equations","Microelectronics","Circuit simulation","Data mining"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
Type :
conf
DOI :
10.1109/ESSDERC.1997.194514
Filename :
1503444
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619450
