DocumentCode :
3619467
Title :
Parasitic bipolar effects leading to on-state breakdown in 2D-MESFETs
Author :
G. Meneghesso;A. Neviani;M. Pavesi;M. Hurt;W.C.B. Peatman;M. Shur;C. Canali;E. Zanoni
Author_Institution :
Università
fYear :
1997
fDate :
6/19/1905 12:00:00 AM
Firstpage :
724
Lastpage :
727
Keywords :
"Electric breakdown","Impact ionization","Decision support systems","FETs","MESFETs","Electrons","Geometry","Performance evaluation","Temperature","Electroluminescent devices"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
Type :
conf
DOI :
10.1109/ESSDERC.1997.194531
Filename :
1503461
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619467
