• DocumentCode
    3619467
  • Title

    Parasitic bipolar effects leading to on-state breakdown in 2D-MESFETs

  • Author

    G. Meneghesso;A. Neviani;M. Pavesi;M. Hurt;W.C.B. Peatman;M. Shur;C. Canali;E. Zanoni

  • Author_Institution
    Università
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    724
  • Lastpage
    727
  • Keywords
    "Electric breakdown","Impact ionization","Decision support systems","FETs","MESFETs","Electrons","Geometry","Performance evaluation","Temperature","Electroluminescent devices"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194531
  • Filename
    1503461
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619467