مرکز منطقه ای اطلاع رساني علوم و فناوري - Projecting Device Lifetime for Scaling Technology Generations with the Quasi-Static model

DocumentCode :

3619484

Title :

Projecting Device Lifetime for Scaling Technology Generations with the Quasi-Static model

Author :

A. Bravaix;D. Goguenheim;N. Revil;E. Vincent;P. Mortini

Author_Institution :

ISEM, Toulon, France

fYear :

1998

fDate :

6/20/1905 12:00:00 AM

Firstpage :

552

Lastpage :

555

Keywords :

"CMOS technology","Degradation","Isolation technology","MOSFETs","Stress","Helium","Hot carriers","Voltage","Transconductance","Power generation"

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503611

Link To Document :