DocumentCode :
3619499
Title :
Interface Properties of TiN(x)/n-Si Schottky Contacts Investigated by Low Frequency Noise Measurements
Author :
C.A. Dimitriadis;G. Kamarinos;S. Logothetidis;F.V. Farmakis;J. Brini;N. Mathieu
Author_Institution :
University of Thessaloniki, Greece
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
612
Lastpage :
615
Keywords :
"Schottky barriers","Low-frequency noise","Frequency measurement","Noise measurement","Schottky diodes","Semiconductor diodes","Semiconductor films","Contacts","Tin","Semiconductor device noise"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Print_ISBN :
2-86332-234-6
Type :
conf
Filename :
1503626
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619499
