3619504

Influence of the Guard Ring on the RF Properties of IO Pads

T. Riihisaari;H. Ronkainen;H. Hakojarvi

VTT Electronics, Finland

1998

6/20/1905 12:00:00 AM

632

635

"Radio frequency","Atherosclerosis","Microelectronics","Silicon","BiCMOS integrated circuits","Coupling circuits","Dielectric substrates","Information technology","Testing","Grounding"

ieee

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

2-86332-234-6

conf

1503631